C60 molecular depth profiling of a model polymer
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چکیده
منابع مشابه
C60 molecular depth profiling of a model polymer
The bombardment of a 26 nm poly(methyl methacrylate) (PMMA) film has been studied as a model for depth profiling of polymeric samples using a newly developed C60 þ ion source. Experiments were conducted on a ToF-SIMS instrument equipped with C60 þand Gaþ ion sources. A focused dc C60 þ ion beam was used to etch through the polymer sample at specified time intervals. Subsequent spectra were reco...
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A complex poly(vinylidene difluoride) (PVdF)/poly(methyl methacrylate) (PMMA) based coil coating formulation has been investigated using time-of-flight SIMS (ToFSIMS). Employing a Bi3 + analysis source and a Buckminsterfullerene (C60) sputter source, depth profiles were obtained through the polymeric materials in the outer few nanometres of the PVdF topcoat. These investigations demonstrate tha...
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ژورنال
عنوان ژورنال: Applied Surface Science
سال: 2004
ISSN: 0169-4332
DOI: 10.1016/j.apsusc.2004.03.113